 | Nanotech 2003 Vol. 2
Technical Proceedings of the 2003 Nanotechnology Conference and Trade Show, Volume 2
Chapter 7: Compact Modeling |
| | Unified Length-/Width-Dependent Threshold Voltage Model with Reverse Short-Channel and Inverse Narrow-Width Effects |
| Authors: | S.B Chiah , X. Zhou and K.Y. Lim |
| Affilation: | Nanyang Technological University, SG |
| Pages: | 338 - 341 |
| Keywords: | short-/narrow-channel effects, threshold voltage |
| Abstract: | The objective of this work is to develop a unified geometry-dependent scalable threshold voltage (Vt) model for the entire range of drawn length (L) and drawn width (W) without binning, including reverse short-channel effect (RSCE) and inverse narrow-width effect (INWE). This has been achieved based on the ideas of the previous length-dependent Vt(L) model, which allows the unified Vt model to be extended to both length and width dimensions at various bias conditions. |
 | View paper |
| ISBN: | 0-9728422-1-7 |
| Pages: | 600 |
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