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Nanotech 2003 Vol. 2
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Technical Proceedings of the 2003 Nanotechnology Conference and Trade Show, Volume 2
Nanotech 2003 Vol. 2
Technical Proceedings of the 2003 Nanotechnology Conference and Trade Show, Volume 2

Chapter 11:

System Level Modeling

-Analysis and Verification of Processing Sequences
 U. Hansen, U. Triltsch, S. Büttgenbach, C. Germer and H.J. Franke
 Institute for Microtechnology, Braunschweig, DE
-Lumped Modeling of Thermal Inkjet Print Head
 Y-S Lee, M.S. Kim, S. Shin and S.J. Shin
 CSE Center, Samsung Advanced Institute of Technology, KR
-Model for Flow Resistance of a Rare Gas Accounting for Surface Roughness
 T. Veijola
 Helsinki University of Technology, FI
-System Level Analysis for a Locomotive Inspection Robot with Integrated Microsystems
 Y. Jeong, B. Kim, H. Oh and J-O Park
 Korea Institute of Science & Technology, KR
-System Model for MEMS based Laser Ultrasonic Receiver
 W.C. Wilson
 NASA Langley Research Center, US
ISBN:0-9728422-1-7
Pages:600
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