 | MSM 99
Technical Proceedings of the 1999 International Conference on Modeling and Simulation of Microsystems
Chapter 6: Characterization, Parameter Extraction, Calibration |
| - | Acceleration of Inductance Extraction by Means of the Monte Carlo Method |
| | G. Leonhardt and W. Fichtner |
| | Swiss Federal Institute of Technology, Switzerland |
| - | Accurate Inductance Extraction with Permeable Materials Using Qualocation |
| | Y. Massoud, J. Wang and J.K. White |
| | Massachusetts Institute of Technology, U.S.A. |
| - | Reduced-Order Modeling of Lorentz Force Actuation with Modal Basis Functions |
| | M. Varghese, V.L. Rabinovich and S.D. Senturia |
| | Massachusetts Institute of Technology, U.S.A. |
| - | Capacitance Extraction from Complex 3D Interconnect Structures |
| | D. Cartwright, G. Csanak, D. George, R. Walker, A. Kuprat, A. Dengi and W. Grobman |
| | Los Alamos National Laboratory, U.S.A. |
| - | A Technique for Extraction of Macro-Models in System Level Simulation of Inertial Electro-Mechanical Micro-Systems |
| | M.H. Zaman, S.F. Bart, V.L. Rabinovich, C.K. Ghaddar, I. Tchertkov and J.R. Gilbert |
| | Microcosm Technologies, Inc., U.S.A. |
| - | A Wide Frequency Range Surface Integral Formulation for 3-D Inductance and Resistance Extraction |
| | J. Wang, J. Tausch and J.K. White |
| | Massachusetts Institute of Technology, U.S.A. |
| - | Simple ADPL Implementation of a 3D FEM Simulator for Mutual Capacitances of Arbitrarily Shaped Objects Like Interconnects |
| | A. Hieke |
| | Siemens Microelectronics, U.S.A. |
| - | Extraction of Compact Model Parameters for ULSI MOSFETs Using a Genetic Algorithm |
| | J. Watts, C. Bittner, D. Heaberlin and J. Hoffman |
| | IBM Microelectronics Division, U.S.A. |
| - | Modelling Calibration and Validation of Contributions to Stress in the STI Process Sequence |
| | K. Garikipati, V.S. Rao, M.Y. Hao, E. Ibok, I. De Wolf and R.W. Dutton |
| | Stanford University, U.S.A. |
| - | Optimal Design of Computer Experiments for the Generation of Microsystem Macromodels Using IMSET and Non-Parametric Fitting |
| | S.B. Crary, P. Cousseau, D. Armstrong, D.M. Woodcock, O. Dubochet, P. Lerch and Ph. Renaud |
| | University of Michigan, U.S.A. |
| - | Parameter Extraction for a Microwave Micromachined Switch |
| | J. Chen, K.M. Coperich, S-M Kang and J. Schutt-Aine |
| | University of Illinois at Urbana-Champaign, U.S.A. |
| - | Complete Characterization of Electrostatically-Actuated Beams Including Effects of Multiple Discontinuities and Buckling |
| | E.K. Chan, K. Garikipati and R.W. Dutton |
| | Stanford University, U.S.A. |
| - | Numerical and Analytical Modeling of the Piezoelectric Transformer and Experimental Verification |
| | S. Hallaert, E. Sarraute and B. Le Pioufle |
| | URA CNRS 1375, France |
| - | SPDC: An Automatic Generator of Input Data for Process Simulators from Process Flow Data for Manufacturing |
| | T. Tatsumi, H. Ansai, M. Mukai and Y. Komatsu |
| | Sony Corporation, Japan |
| - | IMAP: Interferometry for Material Property Measurement in MEMS |
| | B.D. Jensen, M.P. de Boer and S.L. Miller |
| | Sandia National Laboratory, U.S.A. |
| - | MEMS/MST Model Verification and Materials Parameter Extraction Using MEMSPEC-2000 |
| | A. Gutierrez, S. Aceto, M. Simkulet, D. Patti, M. Liendhard, T. Krawczyk and A. Lundgren |
| | InterScience, Inc, U.S.A. |
| - | HEMT Optimization by Advanced RSM Models |
| | M.D. Profirescu, G. Dima, B. Govoreanu and O. Mitrea |
| | University Politehnica of Bucharest, Romania |
| ISBN: | 0-9666135-4-6 |
| Pages: | 697 |
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