Nano Science and Technology Institute
Technical Proceedings of the 1999 International Conference on Modeling and Simulation of Microsystems
MSM 99
Technical Proceedings of the 1999 International Conference on Modeling and Simulation of Microsystems

Chapter 12:

Semiconductor Device Modeling

-Modelling an NMR Probe for Magnetometry
 G. Boero, D. Schlaefli, P.A. Besse and R.S. Popovic
 Swiss Federal Institute of Technology, Switzerland
-A New Analytical Energy Relaxation Time Model for Device Simulation
 V. Palankovski, B. Gonzalez, H. Kosina, A. Hernandez and S. Selberherr
 TU Vienna, Austria
-Impact of Heat Source Localization on Conduction Cooling of Silicon-on-Insulator Devices
 P.G. Sverdrup, Y.S. Ju and K.E. Goodson
 Stanford University, U.S.A.
-Offset Analysis in CMOS Magnetotransistors by Numerical Simulation
 M. Metz and H. Baltes
 ETH Zürich, Switzerland
-Simulation of the Frequency Limits of SiGe HBTs
 J. Geßner, F. Schwierz, H. Mau, D. Nuernbergk, M. Roßberg and D. Schipanski
 Technische Universitat Ilmenau, Germany
-Closed-Loop MOSFET Doping Profile Optimization for Portable Systems
 M. Stockinger, R. Strasser, R. Plasun, A. Wild and S. Selberherr
 TU Vienna, Austria
-Three-Dimensional Multi-Grid Poisson Solver for Modeling Semiconductor Devices
 S.J. Wigger, M. Saraniti and S.M. Goodnick
 Arizona State University, U.S.A.
-Simulation of the Piezo-Tunnel Effect
 A.P. Friedrich, P.A. Besse, M. Bächtold and R.S. Popovic
 Swiss Federal Institute of Technology of Lausanne, Switzerland
-A Predictive Length-Dependent Saturation Current Model Based on Accurate Threshold Voltage Modeling
 K.Y. Lim, X. Zhou and D. Lim
 Nanyang Technological University, Singapore
-Structure Optimization of 140 GHz Pulsed-Mode IMPATT Diode
 A. Zemliak, C. Celaya and R. Garcia
 Puebla Autonomous University, Mexico
-Implementation of Strain Induced Effects in Sensor Device Simulation
 K. Matsuda and Y. Kanda
 Naruto University of Education, Japan
-Self Aligned Gate JFETs for Smart MEMS
 S. Amon, D. Vrtacnik, D. Resnik, D. Krizaj, U. Aljancic and A. Levstek
 University of Ljubljana, Slovenia
-Measuring and Characterizing Sub-Micron Short Channel LDD MOSFETs
 P.C. Liu and H. Lin
 Nanyang Technological University, Singapore
-Modelling High Built-In Electric Field Effects on Generation-Recombination Rates in Space-Charge Regions of pn a-Si:H Junctions
 J. Furlan, Z. Gorup, F. Smole and M. Topic
 University of Ljublijana, Slovenia
-An Analytical Field Effect Mobility Model of N- and P-Channel Poly-Si TFTs
 J. Kung
 National Lienho College of Technology and Commerce, Taiwan
ISBN:0-9666135-4-6
Pages:697
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