 | MSM 98
Technical Proceedings of the 1998 International Conference on Modeling and Simulation of Microsystems
Chapter 5: Characterization, Parameter Extraction, Calibration |
| - | Microelectromechanical Systems (MEMS) Design and Design Automation Research Projects at Duke University |
| | A. Dewey and R.B. Fair |
| | Duke University, U.S.A. |
| - | Characterization of Electrostatically-Actuated Beams Through Capacitance-Voltage Measurements and Simulations |
| | E.K. Chan, K. Garikipati, Z.K. Hsiau and R.W. Dutton |
| | Stanford University, U.S.A. |
| - | 1/f Noise Characterization of a Surface-Micromachined Suspended Gate FET |
| | H. Fu, M.L. Kniffin, G. Watanabe, M.P. Masquelier and J. Whitfield |
| | Motorola, Inc., U.S.A. |
| - | Fast Inductance Extraction of 3-D Structures with Non-Constant Permeabilities |
| | Y. Massoud and J.K. White |
| | Massachusetts Institute of Technology, U.S.A. |
| - | Augmented Reality as an Interactive Tool for Microscopic Imaging, Measurement and Model Based Verification of Simulated Parts |
| | A. Sulzmann, C. Schütz, H. Hügli and J. Jacot |
| | EPFL, Switzerland |
| - | Simple Method of Characterizing CMOS Channel Dopant Profiles Using CV Technique |
| | D. Kapila, M. Kulkarni, C. Fernando, J. Davis, K. Vasanth and G. Pollack |
| | Texas Instruments, Inc., U.S.A. |
| - | Rational RSM Models for Device Characteristics as Functions of Process Parameters |
| | Y. Granik and V. Moroz |
| | PDF Solutions, Inc., U.S.A. |
| - | Methodology for Calibrating Process and Device Simulators by Extracting Model Parameters from Electrical Data |
| | H-M Ho, Y. Zu, K.V. Loiko and D.H.Y. Lim |
| | Chartered Semiconductor Manufacturing Ltd., Singapore |
| - | Validation and Calibration of Electrothermal Device Models Using Infrared Laser Probing Techniques |
| | R. Thalhammer, C. Fürböck, N. Seliger, E. Gornik and G. Wachutka |
| | Technical University of Münich, Germany |
| - | Analysis and Characterization of Laterally Induced Electrostatic Repulsive Forces |
| | K.B. Lee and Y-H Cho |
| | Korea Advanced Institute of Science and Technology, Korea |
| - | Inductance Extraction by Means of the Monte Carlo Method |
| | G. Leonhardt, C. Hager, P. Regli, W. Fichtner |
| | ETH-EPFL, Switzerland |
| ISBN: | 0-96661-35-0-3 |
| Pages: | 678 |
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