Authors: S. Luryi & A. Pacelli
Affilation: State University of New York at Stony Brook, United States
Pages: 702 - 709
Keywords: compact models, device simulation, RF, interconnects, self-heating
We review a recently proposed methodology for automatic generation of equivalent circuits from physical device simulation. The method is based on the calibration of a simplified equivalent-circuit model on simulation results, and can achieve an optimum balance of model complexity, accuracy, and generality. We discuss some f the possible applications of the technique to the modeling of active devices, parasitic element, and complex physical effects such as self-heating and hot-carrier transport.