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 | Nanotech 2002 Vol. 1
Technical Proceedings of the 2002 International Conference on Modeling and Simulation of Microsystems
Chapter 13: Compact Modeling |
| | The EKV 3.0 Compact MOS Transistor Model: Accounting for Deep-Submicron Aspects | | Authors: | M. Bucher, C. Enz, F. Krummenacher, J.M. Sallese, C. Lallement, A.S. Porret | | Affilation: | National Technical University of Athens, Greece | | Pages: | 670 - 673 | | Keywords: | EKV 3.0 compact MOS transistor model, deep-submicron aspects | | Abstract: | The EKV 3.0 compact MOS transistor model for advanced IC design is presented. Its basis is an ideal analytical charge-based model including static to non-quasistatic dynamic aspects and noise. The ideal model is extended to account for the major second-order effects in deep-submicron CMOS technologies resulting from technology scaling and from short-channel effects. It is shown how these nonidealities affect the ideal device characteristics. The increasingly important moderate and weak inversion operation are emphasized. The hierarchical structure of the model is presented, essential features and effects are outlined and illustrated with respect to device characteristics in deepsubmicron CMOS. |  | View paper | | ISBN: | 0-9708275-7-1 |
| Pages: | 764 |
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