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 | Nanotech 2001 Vol. 1
Technical Proceedings of the 2001 International Conference on Modeling and Simulation of Microsystems
Chapter 8: Characterizaton, Parameter Extraction, Calibration |
| | Parameter Extraction for Surface Micromachining Using Eelectrical Characterization of Sensors | | Authors: | M. Maute, S. Kimmerle, J. Franz, J. Hauer, D. Schubert, H.-R. Krauss and D.P. Kern | | Affilation: | Robert Bosch GmbH, Germany | | Pages: | 406 - 409 | | Keywords: | accelerometer, micromachining, parameter extraction, CV-characteristic | | Abstract: | This paper presents a novel methodology for the extraction of process dependent geometrical parameters of surface micromachined sensors. This approach is based on the electrical measurement of static capacitance-voltage characteristics of the sensor element on wafer level. This extraction technique is demonstrated using a surface micromachined inertial accelerometer: a) The measurement of the capacitance-voltage characteristic (CV-characteristic) for lateral actuation of the suspended proofmass results in the extraction of a parameter related both to the thickness of the functional polysilicon layer and the lateral sidewall overetch due to the etch process of the polysilicon [1]. b) For vertical actuation of the proofmass, measurements of CV-characteristics lead to an extracted parameter that is proportional to the sidewall difference angle of the beam cross-section. |  | View paper | | ISBN: | 0-9708275-0-4 |
| Pages: | 638 |
| Hardcopy: | $100.00 |
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