 | Nanotech 2001 Vol. 1
Technical Proceedings of the 2001 International Conference on Modeling and Simulation of Microsystems
Chapter 5: Optimization |
| | A Method for Determining the Dependence of Integrated Circuit Performance on Silicon Process, Device and Circuit Parameters |
| Authors: | L.B. Sipahi, B.A. Myers and T.J. Sanders |
| Affilation: | Intersil Corporation, U.S.A. |
| Pages: | 173 - 172 |
| Keywords: | modeling, simulation, statistical design, wireless communications, semiconductor IC manufacturing |
| Abstract: | The goal of this project is to develop a structured methodology for achieving a design of a block of circuit in an IC which is more compliant to the specification using a multiple simulation approach. This has been accomplished by developing a statistical design and simulation methodology. This methodology has been demonstrated by simulating a Bipolar Low Noise Amplifier (LNA) circuit using micro-level semiconductor device parameters and associated manufacturing process parameters for the circuit parameters of interest. The physics-based device and process models are then coupled with proprietary statistical simulation software (STADIUM') to create a robust circuit design which gives rise to a more compliant product with higher yields. |
 | View paper |
| ISBN: | 0-9708275-0-4 |
| Pages: | 638 |
| Hardcopy: | $100.00 |
| Special: | 3 CD Set — 15% off with Free Shipping |
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