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 | Nanotech 2001 Vol. 1
Technical Proceedings of the 2001 International Conference on Modeling and Simulation of Microsystems
Chapter 10: Semiconductor Device Modeling and Novel Structures Simulation |
| | A Qualitative Study on Global and Local Optimization Techniques for TCAD Analysis Tasks | | Authors: | T. Binder, C. Heitzinger and S. Selberherr | | Affilation: | Technical University Wien, Austria | | Pages: | 466 - 469 | | Keywords: | optimization techniques, inverse modeling, simulation, semiconductors, microelectronics | | Abstract: | We compare the two well-known global optimization methods, simulate annealing and genetic optimization, to a local gradient-based optimization techniques. We rate the applicability of each method in terms of the minimal achievable target value for a given number of simulation runs in an inverse modeling application. The gradient-based optimzer used in the experiment is based on the Levenberg-Marquardt algorithm. The actual implementation (llmin) was taken from MINPACK. The genetic optimzer (genopt) is based on GALIB. FOr the simulated annealing optimzer (siman) and implementation by L. Ingber was taken. All optimzers are capable of evaluating several targets in parallel. |  | View paper | | ISBN: | 0-9708275-0-4 |
| Pages: | 638 |
| Hardcopy: | $100.00 |
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