 | Nanotech 2002 Vol. 2
Technical Proceedings of the 2002 International Conference on Computational Nanoscience and Nanotechnology
Chapter 10: Nanoscale Modeling of Front-End Processing in Silicon |
| - | Spatially Resolved Electron Energy-Loss Spectroscopy, a Tool to Verify Electronic Structure Calculations in Nanostructured Materials |
| | G. Duscher, J. Plitzko, C. Kisielowski, R. Buzko, S.J. Pennycook and S.T. Pantelides |
| | North Carolina State University, US |
| - | Nanoworld Semiconductor Industry - State and Future Challenges of Technology Computer Aided Design |
| | H. Puchner |
| | Cypress Semiconductor, US |
| - | Introducing Monte Carlo Diffusion Simulation into TCAD tools |
| | N. Strecker, V. Moroz and M. Jaraiz |
| | Avant!, US |
| - | Diffusion Mechanisms and Capture Radii in Silicon |
| | K. Beardmore, W. Windl, B.P. Haley and N. Gronbech-Jensen |
| | Motorola, US |
| - | Structural and Electronic Properties of Quantum Dot Surfaces |
| | G. Galli, A Puzder, A.J. Willilamson, J.C. Grossman and L. Pizzagalli |
| | Lawrence Livermore National Laboratory, US |
| ISBN: | 0-9708275-6-3 |
| Pages: | 504 |
| Special: | 3 CD Set — 15% off with Free Shipping |
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