Compact Modeling Committee
Committee Chair
Annual Symposium Synopsys
Compact Models (CMs) for circuit simulation have been at the heart of CAD tools
for circuit design over the past decades, and are playing an ever increasingly
important role in the nanometer system-on-chip (SOC) era. As the mainstream MOS
technology is scaled into the nanometer regime, development of a truly physical
and predictive compact model for circuit simulation that covers geometry, bias,
temperature, DC, AC, RF, and noise characteristics becomes a major challenge.
Workshop on Compact Modeling (WCM) is one of the first of its kind in bringing
people in the CM field together. The objective of WCM is to create a truly open
forum for discussion among experts in the field as well as feedback from
technology developers, circuit designers, and CAD tool vendors.
Topics & Application Areas
The topics cover all important aspects of compact model development and
deployment, within the main theme - compact models for circuit simulation:
- Bulk MOS intrinsic models
- SOI/double-gate/multiple-gate/floating-gate MOS models
- Bipolar/HBT/SiGe/GaN/JFET models
- RF/noise/scalable capacitance/NQS models
- Statistical/predictive/process-based models
- Interconnection/passive device models
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- Extrinsic/parasitic element models
- Reliability/hot carrier/tunneling/ESD models
- Atomic-level/quantum-mechanical compact models
- Numerical/TCAD/behavioral/table-based models
- Model parameter extraction and optimization
- Model-simulator interface and standardization
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Submit Proposal or Comment to Committee Chair
We encourage you to participate and to submit your interest as either an
Scientific Committee Member or to organize a Scientific Committee*. The
NSTI will provide the infrastructure for each Industrial Committee to
organize and present a focused Symposium at the annual Nanotech
Conference and Trade Show (Nanotech 2008,
Boston, Massachusetts, June 1-5, 2008). Details will be provide upon approval of
proposal.
* All submissions will be reviewed by the NSTI Scientific Committee
Chairs and a timely response will be issued.
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