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Nanoscale Characterization Committee

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Committee Chairs

  • Pierre Panine ,
    European Synchrotron Radiation Facility

Annual Symposium Synopsys

Characterization is a cornerstone to nanoscale advancements, both in physical and life sciences. Consequently, NSTI is proud to announce the creation of a Special Conference and Community targeting the vast range of nanoscale characterization techniques including microscopy, scattering, spectroscopy/spectrometry and other tools, along with specimen preparation methods and handling. NSTI will use this event and community to promote the rapid education, dissemination, and commercialization of new characterization techniques into industries based in both physical and life sciences. This symposium seeks to elucidate methods that go well beyond novice understanding, yet are broadly accessible and useful to industrial engineers and technicians.

Critical to the rational design of nanotechnologies, advances in characterization include not only far-field probes such as beams of electrons, ions, neutrons or photons; and near-field proximal probes such as indentors, nanotips, fibers and nanotubes; but also a growing intellectual component whereby data are manipulated, analyzed, rendered and simulated to yield meaningful information. It is essential that this burgeoning knowledge base be collated and transparently presented to the broad nanotechnology community. An array of analytical techniques are more or less sensitive to surface versus bulk, morphology versus chemistry, high- versus low-energy states, fast versus slow dynamics, equilibrium versus perturbed response, elastic versus dissipative interactions, etc.; often a combination of methods is required to achieve the best goal, and we seek insight into these dichotomies to strengthen the base understanding of each technique such that interpretations are not problematic and insight is maximized.

Topics & Application Areas

  • Direct space imaging methods
    TEM, SEM, AFM, near-field optical, X-ray microscopy, topography and tomography, spatially resolved ion mass spectrometry, depth profiling with ions...
  • Indirect space methods
    X-ray, neutron and light scattering...
  • Spectroscopy
    NMR, FTIR, Raman, acoustic, dielectric spectroscopy...
  • Mechanical properties
    Nanometrology, nanotribology, nanoindentation...
  • Rheology, solutions and processing
  • Microfluidics
    Coupled techniques with Lab-on-a-Chip
  • Sample preparation and control
    Thermalization, positioning, connecting...

Submit Proposal or Comment to Committee Chair

We encourage you to participate and to submit your interest as either an Scientific Committee Member or to organize a Scientific Committee*. The NSTI will provide the infrastructure for each Industrial Committee to organize and present a focused Symposium at the annual Nanotech Conference and Trade Show (Nanotech 2008, Boston, Massachusetts, June 1-5, 2008). Details will be provide upon approval of proposal.

* All submissions will be reviewed by the NSTI Scientific Committee Chairs and a timely response will be issued.

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