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Nanoscale Characterization
Symposium Chairs |
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Pierre Panine
E.S.R.F.
European Synchrotron Radiation Facility,
Soft condensed matter group, Grenoble, France
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Confirmed Invited Speakers |
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Symposium Sessions |
| | Monday May 21 |
| 7:00 | Registration |
| 8:30 | Nanotech Conference Opening & Keynotes |
| 10:30 | Nanoscale Characterization: Indirect Space Methods: non-destructive and non-invasive observation |
| 1:30 | Nanoscale Characterization: Indirect Space Methods: non-destructive and non-invasive observation |
| 4:00 | Nanoscale Characterization: Spectroscopy and electrical: electronics & bonding |
| 4:20 | NanoFab: Nanofabrication Equipment, Imaging & Characterization |
| | Tuesday May 22 |
| 7:00 | TUESDAY - Registration |
| 4:00 | Poster Session 1 (4:00 - 6:00) & Expo Reception |
| | Wednesday May 23 |
| 8:30 | Nanoscale Characterization: Force characterization: push, pull, bend |
| 1:00 | Nanoscale Tools |
| 2:00 | Nanotech Poster Session 2 - Expo Reception (2:00 - 4:00) |
| 4:00 | Nanoscale Characterization: Soft Nanotechnology |
| | Thursday May 24 |
| 10:30 | Nanoscale Characterization: Imaging and Profiling: applications to nano |
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Symposium Program |
| | Monday May 21 |
| Back to Top |
| 7:00 |
Registration | Main Lobby |
| Back to Top |
| 8:30 |
Nanotech Conference Opening & Keynotes | Grand Ballroom |
| | Session chair: Bart Romanowicz, NSTI, Andreas Wild, Freescale Semiconductors |
| 8:30 |
How the US Can Ensure Energy Supply for the Future
J. Hofmeister, Shell Oil, US (bio) |
| 9:10 |
National Nanotech Initiative and Industrial Nanotechnology Impact
A.H. Carim, Co-Chair, Nanoscale Science and Engineering Technology, Subcommittee, National Science & Technology Council, U.S. Department of Energy, US (bio) |
| Back to Top |
| 10:30 |
Nanoscale Characterization: Indirect Space Methods: non-destructive and non-invasive observation | Great America K |
| | Session chair: Pierre Panine, ESRF, FR |
| 10:30 |
SAXS, X-ray reflectivity and GISAXS (invited overview presentation)
A. Gibaud, Universite du Maine - Le Mans, FR |
| 11:00 |
Quantitative Synchrotron Grazing Incidence X-ray Scattering and Reflectivity Analysis of Nano-structures and Patterns Supported with Substrates
M. Ree, J. Yoon, K. Heo, K.S. Jin, S. Jin, B. Lee, I. Park, S.C. Choi, G. Kim, H. Kim, W. Oh, Y-H Park, Y. Hwang, J-S Kim, J. Kim, K-W Kim and T. Chang, Pohang University of Science & Technology, KR |
| 11:20 |
MikroGap Detector Technology Applied to Small Angle X-ray Scattering
K. Erlacher, D. Khazins and R. Durst, Bruker-AXS Inc., US |
| 11:40 |
3D structure of nano-scale materials by total x-ray scattering
V. Petkov, Central Michigan University, US |
| Back to Top |
| 1:30 |
Nanoscale Characterization: Indirect Space Methods: non-destructive and non-invasive observation | Grand Ballroom B |
| | Session chair: Pierre Panine, ESRF, FR |
| 1:30 |
Applications of X-ray Measurement Techniques in Nano-Scale Semiconductor Device Manufacturing
D. Agnihotri, Jordans Valley Semiconductors, US (bio) |
| 2:00 |
Determination of micro-structural properties with x-ray absorption fine structure
S.-W. Han, S.-H. Park, H.-J. Yu, E.-S. Jeong, S.-H. Kim, Y.-J. Kim and G.-C. Yi, Chonbuk National University, KR |
| 2:20 |
Ellipsometry Porosimetry : Fast and non destructive method of porosity characterization of cubic mesoporous TiO2 thin films .
C. Defranoux, J.P. Piel, A. Bondaz and L. Kitzinger, SOPRA-SA, FR |
| 2:40 |
Nanoparticle Formation in Supercritical Fluids – The World’s First Real Time In-situ Investigation
H. Jensen, M. Bremholm, R.P. Nielsen, K.D. Joensen, Y-S Chen, J. Almer, E.G. Søgaard, B.B. Iversen and S.B. Iversen, SCF-Technologies, DK |
| 3:00 |
Lattice Engineered Nanoparticles.
P. Casey, C.J. Rossouw, A.B. Murphy and C. Bell, Commonwealth Scientific and Research Organisation, AU |
| Back to Top |
| 4:00 |
Nanoscale Characterization: Spectroscopy and electrical: electronics & bonding | Grand Ballroom B |
| | Session chair: Pierre Panine, ESRF, FR |
| 4:00 |
Analytical Methods for Nanotechnology
I.A. Mowat, J. Moskito, I Ward and A. Hartzell, Evans Analytical Group, US |
| 4:20 |
How to SPION Glass Transitions
M. Concha, S. DeLong, L. Radu, C. Kumar and P. Bidwell-Hanson, University of New Orleans, US |
| 4:40 |
Near-Field Raman and Luminescence Spectroscopies to evidence chemical heterogeneity of surfaces with sub-wavelength spatial resolution.
B. Humbert, J. Grausem, M. Dossot and S. Cremel, LCPME UMR 7564 CNRS-UHP, FR |
| Back to Top |
| 4:20 |
NanoFab: Nanofabrication Equipment, Imaging & Characterization | Great America 2 |
| | Session chair: Andres H. La Rosa, Portland State University and Stanley Pau, University of Arizona |
| 4:20 |
Correlated roughness in polymer film containing magnetic nanoparticles
M.M. Abul Kashem, J. Perlich, L. Schulz, S.V. Roth and P. Müller-Buschbaum, Technische Universität München, DE |
| 4:40 |
An All-Digital Cantilever Controller for MRFM and Scanned Probe Microscopy using a Combined DSP/FPGA Design
D. de Roover, L.M. Porter II, A. Emami-Naeini, J.A. Marohn, S. Kuehn, S. Garner and D.D. Smith, SC Solutions, Inc., US |
| 5:00 |
Highly sensitive Scanning Capacitance Microscope
H. Tanbakuchi, Agilent Technologies, US |
| 5:20 |
Confocal Raman AFM, a powerful tool for the nondestructive characterization of heterogeneous materials
U. Schmidt, F. Vargas, M. Kress, T. Dieing, K. Weishaupt and O. Hollricher, WITec GmbH, DE |
| 5:40 |
Nano Equipment and Materials for Electronics - Market Needs and Outlook
L. Sheet, SEMI, US |
| | Tuesday May 22 |
| Back to Top |
| 7:00 |
TUESDAY - Registration | Main Lobby |
| Back to Top |
| 4:00 |
Poster Session 1 (4:00 - 6:00) & Expo Reception | Exhibit Hall |
| | Wednesday May 23 |
| Back to Top |
| 8:30 |
Nanoscale Characterization: Force characterization: push, pull, bend | Grand Ballroom H |
| | Session chair: Pierre Panine, ESRF, FR and Greg Haugstad, University of Minnesota, US |
| 8:30 |
The MINATEC Nanoscale Characterization Centre: Comprehensive and complementary analysis tools for nanoelectronics
F. Rieutord, Center for Atomic Energy - Grenoble, FR |
| 9:00 |
The Casimir Force and quantum interaction between conducting macro-bodies at nanoscale distances
V. Petrov, M. Petrov, V. Bryksin, J. Petter and T. Tschudi, Darmstadt Technical University, DE |
| 9:20 |
Nanoscale Deformation Measurements for Reliability Assessment of MEMS and NEMS
J. Keller, D. Vogel and B. Michel, Fraunhofer Institute for Reliability and Microintegration (IZM), DE |
| 9:40 |
Effective Use of Focused Ion Beam (FIB) in Investigating Fundamental Mechanical Properties of Metals at the Nano-Scale.
J.R. Greer and W.D. Nix, Palo Alto Research Center, US |
| Back to Top |
| 1:00 |
Nanoscale Tools | Grand Ballroom G |
| | Session chair: John Tucker, Keithley Instruments |
| 1:00 |
Avoiding self-heating effects and measurement errors on nanoscale devices using Pulse I-V techniques
J. Tucker, KeithleyInstruments, Inc., US |
| 1:20 |
Computer aided design of nano-scale technologies
K. Stokbro, Atomistix, US |
| 1:40 |
Electronic and magnetic transport measurements with probe stations
J. Lindemuth, Lake Shore Cryotronics, US |
| 2:00 |
Nanopositioners – An essential part of the nanotechnology toolkit
J.F. MacKay, Mad City Labs, US |
| 2:20 |
Attributes of DPN® – compelling nanotechnology; Unique Advantages of NSCRIPTOR™
J. Haahein, Nanoink, US |
| Back to Top |
| 2:00 |
Nanotech Poster Session 2 - Expo Reception (2:00 - 4:00) | Exhibit Hall |
| Back to Top |
| 4:00 |
Nanoscale Characterization: Soft Nanotechnology | Grand Ballroom E |
| | Session chair: Greg Haugstad, University of Minnesota, US |
| 4:00 |
Understanding and utilizing molecular constraints in nanoscale material designs
S. Sills and R.M. Overney, Micron Technology, Inc., US (bio) |
| 4:30 |
Seeing and feeling nano with intermittent-contact AFM: it’s all in the details (invited overview presentation)
G. Haugstad, University of Minnesota, US (bio) |
| 5:00 |
Advanced CryoTEM and Tomography for Two- and Three-Dimensional Nano-Characterisation of Soft Matter
E. Sourty, F. de Haas, P.M. Frederik, J. Loos, D.J. Stokes and D.H.W. Hubert, FEI Company, NL |
| 5:20 |
Characterisation of Native-State Soft Matter using ‘Multi-Mode’ Electron Microscopy
D.J. Stokes, E. Baken, B.H. Lich and D.H.W. Hubert, FEI Company, NL |
| | Thursday May 24 |
| Back to Top |
| 10:30 |
Nanoscale Characterization: Imaging and Profiling: applications to nano | Room 209 |
| | Session chair: Greg Haugstad, University of Minnesota, US |
| 10:30 |
Accommodation of Characterization Tools
L. York, Abbie Gregg, Inc., US |
| 11:00 |
The Impact of Advanced S/TEM on Atomic-Scale Characterisation and Analysis
D.H.W. Hubert, B. Freitag and D.J. Stokes, FEI Company, NL |
| 11:20 |
In-situ Gas Injection-Heating Atomic Resolution TEM for Nanomaterials
X.F. Zhang, Hitachi High Technologies America, Inc., US |
| 11:40 |
Image-based Nanocrystallography in Two and Three Dimensions with open-access database support
P. Moeck, R. Bjorge and P. Fraundorf, Portland State University, US |
| 12:00 |
Multi-frequency, repulsive-mode amplitude-modulated atomic force microscopy imaging mode
R. Proksch, J. Cleveland, J. Li and A. Moshar, Asylum Research, US |
| 12:20 |
Characterisation of Electrical Fields of Buried Interdigitated Nanoscale Ti-Electrode Arrays by a Novel Atomic Force Microscopy Measurement Procedure and Their Fabrication by FIB Milling
M.G. Jenke, Ch. Santschi and P. Hoffmann, EPFL (Ecole Polytechnique Fédérale de Lausanne), CH |
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Special Symposium
Characterization is a cornerstone to nanoscale advancements, both in
physical and life sciences. This symposium targets a wide range of
nanoscale characterization techniques including microscopy, scattering,
spectroscopy/spectrometry, nanomechanical and other tools, along with
specimen preparation methods and handling. It is essential that this
burgeoning knowledge base be transparently presented to the broad
nanotechnology community. NSTI will use this event to promote the rapid
education, dissemination, and commercialization of new characterization
techniques into industries based in both physical and life sciences. The
symposium seeks to introduce general technique types to newcomers,
report pioneering methods, and drill down into new physical
understandings, all the while emphasizing applications useful to
industrial engineers and technicians.
Advances in characterization include not only far-field probes (e.g.,
beams of electrons, ions, neutrons or photons) and near-field probes
(indentors, nanotips, fibers and nanotubes), but also a growing
intellectual component whereby data are manipulated, analyzed, rendered
and simulated to yield meaningful information. As some tools and methods
have become more common and practical, certain misunderstandings and
misinterpretations also have crept into the lexicon. Thus this symposium
will include an element of “methods training” to promote the
insightful application of characterization tools in nanotechnology
R&D.
We encourage your participation in this event and community, through
your comments, suggestions and offers for assistance in review and
organization. Please contact the symposium coordinator with your
comments.
Topics & Application Areas
Online abstract submissions are now being accepted. Proposed topics include, but
are not be limited to:
- Direct space imaging methods
TEM, SEM, AFM, near-field optical, X-ray microscopy, topography and tomography, spatially resolved ion mass spectrometry, depth profiling with ions…
- Indirect space methods
X-ray, neutron and light scattering...
- Spectroscopy
NMR, FTIR, Raman, acoustic, dielectric spectroscopy...
- Mechanical properties
Nanometrology, nanotribology, nanoindentation...
- Rheology, solutions and processing
- Microfluidics
Coupled techniques with lab-on-a-chip
- Sample preparation and control
Thermalization, positioning, connecting...
A special joint session with the Soft Nanotechnology and Polymer Nanotechnology symposia will be
devoted to Characterization of Soft Nanostructured Materials.
A special joint session with the Bio
Sensors & Diagnostics symposium will be devoted to Characterization for
Biomedical Applications.
Journal Submissions
Journal of Experimental Nanoscience
Selected Nanotech Proceedings papers will be reviewed
and invited into a Special Issue of the Journal of Experimental Nanoscience.
The journal provides a showcase for advances in the experimental
sciences underlying nanotechnology and nanomaterials.
For consideration into this Special Issue of the Journal of
Experimental Nanoscience, please select the “Submit to Journal of
Experimental Nanoscience” button during the on-line submission
procedure. You may only select a single journal during the submission
process.
Conference Quick Links
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